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1
To the digital age : research labs, start-up companies, and the rise of MOS technology
Published 2002Full text (MCPHS users only)
Electronic eBook -
2
Oxide reliability : a summary of silicon oxide wearout, breakdown, and reliability
Published 2002Full text (MCPHS users only)
Electronic eBook -
3
Geometric models for rolling-shutter and push-broom sensors
Published 2014Full text (MCPHS users only)
Electronic eBook -
4
Technology evolution for silicon nano-electronics : selected, peer reviewed papers from the proceedings of the International Symposium on Technology Evolution for Silicon Nano-Elec...
Published 2011Full text (MCPHS users only)
Electronic Conference Proceeding eBook