Swift ion beam analysis in nanosciences /

Swift ion beam analysis (IBA) of materials and their surfaces has been widely applied to many fields over the last half century, constantly evolving to meet new requirements and to take advantage of developments in particle detection and data treatment. Today, emerging fields in nanosciences introdu...

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Bibliographic Details
Online Access: Full text (MCPHS users only)
Main Authors: Jalabert, Denis (Author), Vickridge, Ian, 1958- (Author), Chabli, Amal (Author)
Format: Electronic eBook
Language:English
Published: London, UK : Hoboken, NJ : ISTE, Ltd. ; Wiley, 2017
Series:RSC nanoscience & nanotechnology.
Subjects:
Local Note:ProQuest Ebook Central