Cluster secondary ion mass spectrometry : principles and applications /
This book describes the importance of the emerging technique Cluster Secondary Ion Mass Spectrometry (SIMS), which is used for the analysis of a range of solid materials, including everything from organic and polymeric materials, to cells and semiconductors. The text covers a wide range of topics, e...
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| Online Access: |
Full text (MCPHS users only) |
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| Main Author: | |
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Hoboken, New Jersey :
Wiley,
2013
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| Subjects: | |
| Local Note: | ProQuest Ebook Central |
