Cluster secondary ion mass spectrometry : principles and applications /
This book describes the importance of the emerging technique Cluster Secondary Ion Mass Spectrometry (SIMS), which is used for the analysis of a range of solid materials, including everything from organic and polymeric materials, to cells and semiconductors. The text covers a wide range of topics, e...
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| Online Access: |
Full text (MCPHS users only) |
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| Main Author: | |
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Hoboken, New Jersey :
Wiley,
2013
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| Subjects: | |
| Local Note: | ProQuest Ebook Central |
| Summary: | This book describes the importance of the emerging technique Cluster Secondary Ion Mass Spectrometry (SIMS), which is used for the analysis of a range of solid materials, including everything from organic and polymeric materials, to cells and semiconductors. The text covers a wide range of topics, encompassing fundamentals, theory, and applications including cluster sources, organic and polymeric depth profiling, and 3-D imaging in organic and polymeric materials. Written by founders in the field, this guide creates a peerless compendium of knowledge on this cutting edge set of methods. |
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| Physical Description: | 1 online resource (350 pages) |
| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 9781118589335 1118589335 9781118589250 1118589254 0470886056 9780470886052 9781299475878 1299475876 9781118589243 1118589246 |
| Source of Description, Etc. Note: | Online resource; title from PDF title page (Wiley; viewed on May 28, 2013). |
