Atomic force microscopy in nanobiology /

Recent developments in atomic force microscopy (AFM) have been accomplished through various technical and instrumental innovations, including high-resolution and recognition imaging technology under physiological conditions, fast-scanning AFM, and general methods for cantilever modification and forc...

Full description

Saved in:
Bibliographic Details
Online Access: Full text (MCPHS users only)
Other Authors: Takeyasu, Kunio (Editor)
Format: Electronic eBook
Language:English
Published: Boca Raton, Florida : CRC Press, 2014
Subjects:
Local Note:ProQuest Ebook Central